| Name |
DS-410 |
| Geometry |
D/8,SCI+SCE |
| Repeatability |
dE*ab≤0.03 |
| Display Resolution |
0.01 |
| Measuring aperture |
3 w/ plate and 3 w/o plate:
Φ11mm,Φ6mm,Φ3mm
▽11mm,▽6mm,▽3mm |
Measurement
index |
Reflectance,CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy,RGB,Color difference(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),WI(ASTME313-00,ASTM E313-73,CIE,ISO2470/R457,,AATCC,Hunter,
TaubeBergerStensby),
YI(ASTM D1925,ASTM E313-00,ASTM E313-73),Blackness(My,dM),
Color Fastness, Tint,( 63690494,ASTM E313-00),Color Density CMYK(A,T,E,M),Milm, Munsell,
Opacity, Color strength |
| Illuminants |
A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84,ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5,LED-BH1,LED-RGB1,LED-V1, LED-V2 |
| Light Source |
Full-band balancedLED light source |
| Observer Angles |
2°,10° |
| Sphere Size |
40mm |
| Standards |
CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 |
| Spectroscopic method |
Nanometer integrated spectral device |
| Sensor |
Silicon photodiode array double 16 groups |
| Wavelength Interval |
10nm |
| Wavelength Range |
400-700nm(Users can view the reflectivity of 31 wavelengths) |
| Reflectance Range |
0-200% |
| Reflectivity resolution |
0.01% |
| Measurement method |
Single measurement, average measurement (2~99 times) |
| Measurement time |
About 1 second |
Measurement and
observation mode |
Camera |
| Calibration |
Intelligent automatic calibration |
| Software support |
Andriod,iOS,Windows,WeChat applet |
| Accuracy |
Metrology Level I |
| Interface |
USB,Bluetooth |
| Screen |
Full Color Screen,2.4 inches |
| Battery capacity |
Rechargeable, 8000 times continuous tests, 3.7V/3000mAh |
| Light Source Lifetime |
10 years, 1 million tests |
| Language |
Chinese and English |
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