| Model |
CRX-60 |
CRX-62 |
CRX-66 |
| Geometry* |
45/0 |
| Repeatability** |
dE*ab≤0.1 |
dE*ab≤0.05 |
dE*ab≤0.02 |
| Inter-instrument agreement*** |
/ |
/ |
dE*ab≤0.25 |
| Display accuracy |
0.01 |
| Measuring/Lighting calibers |
Φ8mm/Φ21mm |
| Measurement index |
CIE-Lab,XYZ |
Light source condition,
CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy,
RGB,chromatic aberration(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),whiteness(ASTM
E313-00,ASTM E313-73,CIE,ISO2470/R457,AATCC,
Hunter,Taube Berger Stensby),yellowness(ASTM D1925,
ASTM E313-00,ASTM E313-73),blackeness(My,dM),
color fastness,color fastness,Tint(ASTM E313-00),
color densityCMYK(A,T,E,M)
|
| Light source condition |
A,C,D65 |
A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,
F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84,
ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5,
LED-BH1,LED-RGB1,LED-V1, LED-V2
|
| Lighting source |
Full band balancedLED light source |
| Field angle |
2°,10° |
| Meet a criterion |
CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 |
| Spectroscopic method |
Nanobeam splitting device |
Raster |
| SenSor |
Silicon optical array device |
Dual-row high-precisionCMOS array sensor |
| Wavelength interval |
10nm |
| Wavelength coverage |
400-700nm |
| Reflectance measurement range |
0-200% |
| Reflectance resolution |
0.01% |
| Measurement and observation mode |
Visual |
| Calibration |
Intelligent automatic calibration |
| Accuracy guarantee |
Ensure the first level of measurement |
| Measuring time |
Single measurement 110ms |
Single measurement50ms |
| Measuring interval |
1s |
| Port |
USB,485,232,External trigger, analog output, Ethernet |
| Screen |
No |
Full color screen,3.5 inches |
| Light source lifetime |
1 million times in 10 years |
| Language |
/ |
Simplified Chinese, English |
| Non-contact distance |
5mm |
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